Forum Report 2013


                  
 The 22st NCSLI-Japan Technical Forum along with the NMIJ metrology seminar, under the auspices of the Japan Measurement Forum (JMF), was held on Friday, November 8th, 2013, at Ota-ku Industrial Plaza (PiO) in Tokyo with about 300 participants.

 It was the 11th year of JMF’s Symposium where NCSLI Japan and NMIJ have collaborated to hold the Japan’s largest metrology symposium. With the years of history we continue to thrive to make the event meaningful to those in the field of metrology. Seven papers were presented at NCSLI-Japan session and another seven papers at NMIJ session. And there were also poster sessions and exhibitions hosted.

 On the first floor of the Exhibition Hall there was an exhibition of test and measurement equipment. 16 organizations exhibited a variety of products and services, displaying their products and discussing a wide range of metrology applications. With such an attendance, it was evident that there were strong interests in metrology, and test and measurement. The forum was very successful, and much of this was due largely to ardent voluntary supporters, the lecturers, and participants.

We would like to take this opportunity to thank everyone who attended for your support and participation, and hope to see you all at the Forum next year.

The forum of the next year becomes held alone.
 
Giving a lecture(1)Giving a lecture(2)
Giving a lecture(3)Giving a lecture(4)
Giving a lecture(5)Paper presenters gathered with NCSLI-J board members
At the receptionSocial session
  
【 PROGRAM 】

[1] Comparison Test and Uncertainty of Measurement by National-standard Class Measuring System for Lightning Impulse voltage
・・・ Mitsubishi Electric Corporation

[2] An overview of a phasor measurement unit (PMU) and its calibration
・・・NMIJ/AIST

[3] Fluke Thermometer and its patents
・・・TFF Cooperation Fluke Company

[4] Thermocouples with Improved High-Temperature Creep Property by Oxide Dispersion Strengthening
・・・ Tanaka Kikinzoku Kogyo K.K.

[5] Measurement and Standard of High Dewpoint
・・・Shinyei Technology Co., Ltd.

[6] Calibration of contact instruments for measurement of surface texture
・・・JQA

[7] The management of the measurement risk and adequacy of the inspection specification.
 〜Risk management by the measuring system in consideration of a standard consumer’s risk.〜
・・・ Murata Manufacturing Co., Ltd.

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