|  The 13th Annual NCSLI-Japan Forum was held at the Tokyo Metropolitan Ohta-ku Industrial Plaza on November 5, 2004, with 515 attendees. This year’s forum was organized as The Japan Measurement Standards Forum Second Symposium in collaboration with NMIJ, NITE, JAMP, JEMIC, JMIF, and JQA, under auspices of the Ministry of Economy, Trade, and Industry. There were six major sessions: (1) Accreditation (2) Calibration, Measurement and Management (3) National Measurement Standards (4) Traceability and Users (5) Legal Metrology (6) International|
|Image1:Dr. Seta presents the keynote speech.|
The forum was opened with the special guest speaker, Mr. Dave Agy, President of NCSL International. He gave a talk entitled “New Publications from NCSLI. After his talk Accreditation Session, Calibration, Measurement and Management Session, and National Measurement Standards Session were held in parallel in the morning. The afternoon sessions were opened with the greeting wards from Mr. Yuji Tokumasu of METI, and the keynote speech entitled “Trend in the Fields of Standards and Conformance and the Role of Metrology” by Dr. Katsuo Seta of IAJapan/NITE, followed by Traceability and Users Session, Calibration, Measurement and Management Session, Legal Metrology Session, and International Session.
|Image2:Mr. Ode, Vice Chairman of NCSLI Japan, played a very important role in organizing this forum.|
|There were 17 organizations in the exhibitors hall showing their products and services.|
|Image3:Exhibitor’s booth allows the attendees to look at new equipment and services, and to talk with knowledgeable factory experts.||Image4:Most of the forum directors being called up to front row for recognition of their hard work.|
|Image5:NCSLI Japan directors and honorable paper presenters gather for a final photograph. It takes a LOT of dedicated workers to roll out an effective symposium for 516 attendees. Very impressive indeed.|
|Image6:Mr. Sugiyama wins a door prize.|| |
|The following papers were presented in the sessions:
|●  Activities of the JCSS Accredited Laboratories Group
By Katsuya Sato of Japan Association for Metrology Promotion
●  Survey of the Customer Satisfaction at the Assessment of the JCSS
●  Uncertainty Evaluation in International Comparison
|Calibration, Measurement and Management Session:|
|●   Verification of Measuring Instrument for Environmental Monitoring
By Tatsuya Mogi of Japan Quality Assurance Organization
●  Needs of Environment Measurement in a Field of Foods Recycling Process
●  Environmental Improvement by Plasma and its Measurement
●  Recent Trends and Future Prospects in High-Temperature Standards
●  Study of the Characteristics of Metal-Sheathed Standard Platinum Resistance Thermometers and Secondary Platinum Resistance Thermoneters
●  Calibration of the Pressure Balance
●  DMM’s Automated Calibration by MET/CAL Plus
●  The Design of an Impedance Scaling Fixture for Low Impedance Measurement
|National Measurement Standards Session:|
|●   DC and Low Frequency Electrical Standards
By Shogo Kiryu of NMIJ/AIST
●  Development and Calibration Services of Electromagnetic Field Standars
●  Reference Materials for Nanotechnology
●  Optical Frequency Standards at Telecommunication Band and its Applications
|Traceability and Users Session:|
|●   An Economic Effect of Traceability
By Shigemitsu Kuwayama of Mettler-Toledo K.K.
●  Product Conformity Testing and Traceability
●  Regarding Maintenance of Measurement Equipment for Aircraft
●  The result of Laser Power Inter-Laboratory Comparison
●  2006: The Year of Change in Europe
|Legal Metrology Session:|
|●   New Approach for Measurement Law and JIS
By Daisuke Kobayashi of Weights and Measures Policy Office, METI
●  Clinical Electrical Thermometers with Maximum Device and Clinical Thermometers (Mercury-in-Glass, with Maximum Device)
●  Non-Automatic Weighing Instrument
|●   Mutual Recognition in Laboratory Accreditation (ILAC and APLAC-MRA)
By Yoshinobu Uematsu of APLAC-PTC (IAJapan/NITE)
●  Mutual Recognition in Metrology Standards (CIPM-MRA) and Role of Asia-Pacific Metrology Programme (APMP)
●  Mutual Recognition Arrangements by Government between Japan-EU and Japan-Singapore
|The folloing organizations had a booth to show their products and services:|
・Alpha Electronics Corporation
・Hayashi Denkko Co., Ltd.
・Japan Association for Metrology Promotion
・Japan Electric Meters Inspection Corporation
・Japan Electronics and Information Technology Industries Association
・Japan Measurement Instruments Federation
・Japan Quality Assurance Organization
・Key Techno Co., Ltd
・National Metrology Institure of Japan, AIST
・National Institute of Technology and Evaluation
・Nippon Netsudenki Seisakusho Co.
・ORIX Rentec Corporation
・Traceability Research Association
・Yamari Industrial Ltd.
・Yokogawa Electric Corporation
|The forum was organized by the following dedicated volunteers with many other helpers:|
|・Akiu Yamazaki, Agilent Technology Japan
・Jun Ode, Tokyo Metropolitan Industrial Technology and Research Institute
・Hidetoshi Nakano, NMIJ
・Hisao Nishiyama, Fuji Xerox Co., Ltd.
・Katsuhiko Setsurakku, Key Techono Co. Ltd.
・Katsumi Yokoi, Agilent Technology Japan
・Katsuya Sato, JAMP
・Makoto Sata, Yamari Industries, Ltd.
・Masanori Sakairi, JMIF
・Mitsuo Ishii, Metcal Co., Ltd.
・Motoaki Shibano, Yokogawa Electronics Manufacturing
・Naomi Ito, JMIF
・Nofumi Ochiai, JQA
・Norio Ishizaki, NITE
・Shigeaki Hatakeyama, JEMIC
・Shigeru Suematsu, JEMIC
・Takashi Sugiyama, JQA
・Takashi Togo, ORIX Rentec
・Takeharu Nishi, Yokogawa Rental & Lease Co.
・Takeshi Ito, NMIJ
・Takeo Chiba, NMIJ
・Tetsuo Takita, NMIJ
・Toshihide Ihara, NMIJ
・Toshihiko Kamikite, Fluke
・Tsutomu Tsuchiya, Yamatake Corporation
・Yasuhiro Niwano, NITE
・Yoshiharu Horikawa, JEMIC
・Yoshinobu Kasumi, Yokogawa Electric Corporation
・Yoshitaka Kato, Caltech Co.