|  The 14th Annual NCSLI-Japan Forum was held at the Tokyo Metropolitan Ohta-ku Industrial Plaza on November 25, 2005, with approximately 450 attendees. The forum was organized as The Japan Measurement Standards Forum Third Symposium, and operated by NCSLI Japan and NMIJ in collaboration, under the auspices of the Ministry of Economy, Trade, and Industry. Other participating organizations were NITE, JAMP, JEMIC, JQA, JMIF, FAA, CERI, JAB, JSA, JEMIMA, JEMA, JEITA, JAPIA, JTM, JMCT, JEMCA, MMRN. There were six major sessions: (1) Accreditation (2) Calibration, Measurement and Management (NCSLI-J) (3) National Measurement Standards (NMIJ) (4) Traceability and Users (5) Legal Metrology (6) International|| |
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The forum was opened with greeting message by Mr. Masahiko Yoshida of METI, followed by a special guest speech entitled “Measurement in the automotive industry” by Mr. Keiichi Murata, VP of Nissan Motors. The Accreditation Session, the Calibration, Measurement and Management Session, and the Legal Metrology Session were held in parallel in the morning; in the afternoon, The National Metrology Institute session, the NCSLI-J session, the Traceability and Users Session, and International Session.
|There were 19 organizations in the exhibitors hall showing their products and services.|
|The following papers were presented in the sessions:
|●  Realization for “Open Door” JCSS
By Hiromi Murata of IAJapan/NITE
●  The Revision of New ISO/IEC 17025 and Perspective to Remote-Calibrartion
●  Accreditation of ASNITE-Calibration for thermal conductivity reference plate
|Calibration, Measurement and Management Session:|
|●   Introduction to Assets and Calibration Management Solution Service
By Atsushi Fujima of ORIX Rentec Co.
●  The Certification of the Traceability of Anritsu Customer Services Co., Ltd.
●  Design of the Pressure Calibration Manual with an Animation Technology
●  Introduction of Frequency JCSS Calibration System
●  Calibration of Standard Microscale with an Optical Diffraction Pitch Calibration Apparatus
●  JCSS Calibration and its Equipment for the Temperature range between -40 ℃ and 1,100 ℃
●  Introduction of the Traceability and Calibration System of the High Precision Wattmeter
●  The Wattmeter Calibration System with the instrument Transformer
●  Building the Metrology Standard Across the Pacific Ocean Case of 4TP Capacitance Standard (1960 to 2010)
|National Metrology Institute Session:|
|●   Inductance Standards at NMIJ
By Akihiko Yonenaga of NMIJ/AIST
●  Calibration Methods and Uncertainty Evaluations of RF Power Meters Development
●  Laser Power and Optical Attenuation Standards
●  Generation of Time and Frequency Standard and Calibration Service Systems in NMIJ
●  Realization of the International Temperature Scale and Its Calibration Services in Low Temperature Region at NMIJ
●  Development of NMIJ CRMs on Plastics in Response to RoHS Directive
|Legal Metrology Session:|
|●   Outline of Measuring Instruments Directive (MID)
By Hiroaki Morinaka of NMIJ/AIST
●  Overview of Software Examination in MID
|Traceability and Users Session:|
|●   Economic Impact of Traceability in Metrology
By Katsuya Sato of Japan Association for Metrology Promotion
●  What is a measurement uncertainty? Easy to understand “Concept of the seminar of uncertainty for beginners, and its dissemination acitivity”
●  High frequency attenuation inter laboratory comparison
|●   Activities of Conformity Assessment-related ISO standards and their relationship with calibration business
By Mamoru Sumimoto of IA Japan/NITE)
●  Current status of CIPM-MRA
●  The present situation on the measurement standard field in China
|The folloing organizations had a booth to show their products and services:|
・Alpha Electronics Corporation
・Japan Association for Metrology Promotion
・Japan Electric Meters Inspection Corporation
・Japan Electronics and Information Technology Industries Association
・Japan Measurement Instruments Federation
・Japan Quality Assurance Organization
・Key Techno Co., Ltd
・National Institute of Technology and Evaluation
・Nippon Netsudenki Seisakusho Co.
・Ohte Giken, Inc.
・ORIX Rentec Corporation
・Traceability Research Association
・Yamari Industrial Ltd.
・Yokogawa Electric Corporation
|The forum was organized by the following dedicated volunteers with many other helpers:|
|・Akiu Yamazaki, Agilent Technology Japan
・Hidetoshi Nakano, NMIJ
・Hiroaki Sakuma, JEMIC
・Hiromi Murata, NITE
・Hisao Nishiyama, Fuji Xerox Co., Ltd.
・Isao Kishimoto, NMIJ
・Jun Ode, Tokyo Metropolitan Industrial Technology and Research Institute
・Katsuhiko Setsurakku, Key Techono Co. Ltd.
・Katsumi Yokoi, Agilent Technology Japan
・Katsutoshi Kodaka, Fluke
・Katsuya Sato, NMIJ
・Kazumi Hayakawa, Fluke
・Makoto Sata, Yamari Industries, Ltd.
・Masanori Sakairi, JMIF
・Mitsuo Ishii, Metcal Co., Ltd.
・Naomi Ito, JMIF
・Norio Ishizaki, NITE
・Shigeaki Hatakeyama, JEMIC
・Takashi Sugiyama, JQA
・Takashi Togo, ORIX Rentec
・Takeharu Nishi, Yokogawa Rental & Lease Co.
・Toshihide Ihara, NMIJ
・Yoshiharu Horikawa, JEMIC
・Yoshinobu Kasumi, Yokogawa Electric Corporation
・Yoshitaka Kato, Caltech Co.
・Yukihiro Onzo, JQA
And many others