|  The 15h Annual NCSLI-Japan Forum was held at the Tokyo Metropolitan Ohta-ku Industrial Plaza on November 22, 2006, with nearly 500 attendees. The forum was organized as The Japan Measurement Standards Forum Fourth Symposium, and operated by NCSLI Japan and NMIJ in collaboration, under the auspices of the Ministry of Economy, Trade, and Industry. Other participating organizations were NITE, JAMP, JEMIC, JQA, JMIF, FAA, CERI, JAB, JSA, JEMIMA, JEMA, JEITA, JAPIA, JTM, JMCT, JEMCA, MMRN, TRA. There were two courses of sessions in parallel plus NMIJ Posters Session: one course entitled Accreditation and User Traceability session, another course entitled NCSLI-Japan session.|| |
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The forum was opened with a greeting message by Mr. Masahiko Yoshida of METI, followed by a keynote speech entitled “Expanding Role of Measurement Standards ? A view through the revision of VIM” by Dr. Hidetaka Imai, NMIJ/AIST, IAJapan/NITE, JCCLS.
|There were 18 organizations in the exhibitors hall showing their products and services.|
|The following papers were presented in the sessions:
Accreditation and User Traceability Session:
|●  Proceedings around Accreditation for Reference Material Producers
By Takashi Arai of IAJapan/NITE
●  Development of Standard Materials
●  Kick-Off of Japan Accreditation Council
●  Overview of NMIJ Metrology Club
●  A Report of Measurement Standards and National Measurement Institutes in
●  Recent Topics of Measurement Uncertainty in UK, and Introduction of the Uncertainty Seminar for Beginners in Testing
●  Radiation Measurement and Traceability in Protection Field
●  Activities of JCSS Technical WG for New Electrical Field
|NCSLI Japan Session:|
|●  Application of e-trace for Frequency Standard
By Yoshinobu Kasumi of Yokogawa Electric Corporation
●  Realizing the Remote Calibration of Impedance Standards
●  ISO/IEC17025 Calibration DATA Management System
●  Pressure Calibration System of Visual Management
●  Uncertainty Evaluation of the Measurement System Using a YOUDEN Plot
●  Development of a High Accuracy Inductive Voltage Divider with High Input Impedance at Wideband Frequency
●  Evaluating the Calibration and Uncertainty of a Standard AC Voltmeter
●  Application of Super-ultra-fine Mineral Insulated Thermocouple
|The folloing organizations had a booth to show their products and services:|
|・Agilent Technologies Japan, Ltd.
・Alpha Electronics Corporation
・Japan Association for Metrology Promotion
・Japan Electric Meters Inspection Corporation
・Japan Electronics and Information Technology Industries Association
・Japan Measurement Instruments Federation
・Japan Quality Assurance Organization
・Key Techno Co., Ltd
・National Institute of Technology and Evaluation
・Nippon Netsudenki Seisakusho Co.
・Ohte Giken, Inc.
・ORIX Rentec Corporation
・Rohde&Schwarz Japan K.K.
・Traceability Research Association
・Yamari Industrial Ltd.
・Yokogawa Electric Corporation
|The forum was organized by the following dedicated volunteers with many other helpers:|
・Akiu Yamazaki, Agilent Technologies International Japan, Ltd. ・Hiroaki Sakuma, JEMIC ・Hiromi Murata, NITE ・Hisao Nishiyama, Fuji Xerox Co., Ltd. ・Isao Kishimoto, NMIJ ・Jun Ode, Tokyo Metropolitan Industrial Technology Research Institute ・Katsuhiko Setsurakku, Key Techono Co. Ltd. ・Katsumi Yokoi, ORIX Rentec Corporation ・Katsutoshi Kodaka, Fluke ・Katsuya Sato, NMIJ ・Kazumi Hayakawa, Fluke ・Makoto Sata, Yamari Industries, Ltd. ・Masanori Sakairi, JMIF ・Mitsuo Ishii, Metcal Co., Ltd. ・Naomi Ito, JMIF ・Norio Ishizaki, NITE ・Shigeaki Hatakeyama, JEMIC ・Takashi Sugiyama, JQA ・Takashi Togo, ORIX Rentec ・Takeharu Nishi, Yokogawa Rental & Lease Co. ・Tsutomu Tsuchiya ・Yasuhiro Nakamura, NMIJ/AIST ・Yasusuke Matsumoto, CERI ・Yoshiharu Horikawa, JEMIC ・Yoshinobu Kasumi, Yokogawa Electric Corporation ・Yoshitaka Kato, Caltech Co. ・Yukihiro Onzo, JQA ・Yukinobu Miki, NMIJ/AIST  And many others